논문: https://ieeexplore.ieee.org/document/9063543 저자: Jiangxin Yang , Guizhong Fu , Wenbin Zhu , Yanlong Cao , Yanpeng Cao , Member, IEEE, and Michael Ying Yang, Senior Member, IEEE 인용: Yang, Jiangxin, et al. "A deep learning-based surface defect inspection system using multiscale and channel-compressed features." IEEE transactions on instrumentation and measurement 69.10 (2020): 8032-8042. 깃허브: ..